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BS IEC 63150-1:2019
Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment Arbitrary random mechanical vibrations
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Summary
Semiconductor devices;Vibration isolators;Vibration meters;Voltage;Measurement;Evaluation;Mechanical tests
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 04/13/2023 |
| Page Count | 40 |
| Themes | Mechanical tests |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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