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BS IEC 63229:2021
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
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Summary
Substrates (insulating);Semiconductor technology;Electrical equipment;Common terms;Components;Computer components;Computer hardware;Electronic equipment and components;Electrical components
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 08/31/2023 |
| Page Count | 24 |
| Themes | Electrical components |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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