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BS IEC 63275-1:2022
Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors Test bias temperature instability
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Summary
Semiconductor technology;Semiconductor devices;Semiconductors;Diode transistor logic circuits;Transistor transistor logic circuits
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 10/05/2022 |
| Page Count | 16 |
| Themes | Transistor transistor logic circuits |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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