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BS ISO 11938:2012
Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
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Summary
Spectroscopy;X-ray fluorescence spectrometry;Semiconductor diodes;Chemical analysis and testing;Semiconductors;Detectors;Electron beams
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 04/30/2013 |
| Page Count | 22 |
| Themes | Electron beams |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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