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BS ISO 15932:2013
Microbeam analysis. Analytical electron microscopy. Vocabulary
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Summary
Optical instruments;Electron optics;Instrumental methods of analysis;Microscopes;Vocabulary;Electron beams;Electron microscopes;Scanning electron microscopes;Terminology
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 12/31/2013 |
| Page Count | 32 |
| Themes | Terminology |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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31/12/2013
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