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BS ISO 16700:2016
Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
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Summary
Calibration;Magnification;Electron optics;Electron microscopes;Microscopes;Optical instruments;Scanning electron microscopes;Control samples;Optical phenomena;Accuracy;Electron beams
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 07/31/2016 |
| Page Count | 30 |
| Themes | Electron beams |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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31/07/2016
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29/09/2004
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