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BS ISO 17297:2025
Microbeam analysis. Focused ion beam application for TEM specimen preparation. Vocabulary
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Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 05/29/2025 |
| Page Count | 26 |
| Themes | Electron-beam-deflection tubes |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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29/05/2025
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