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BS ISO 17331:2004+A1:2010
Surface chemical analysis. Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
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Summary
Chemical analysis and testing;Surface chemistry;Silicon;Iron;X-ray fluorescence spectrometry;Control samples;Decomposition reactions;Fluorimetry;Spectrophotometry;Substrates (insulating);Nickel;Spectroscopy
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 09/30/2010 |
| Page Count | 28 |
| Themes | Spectroscopy |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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