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BS ISO 17470:2014
Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
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Summary
Spectrophotometry;Instrumental methods of analysis;Microanalysis;Dispersion (waves);Wavelengths;Chemical analysis and testing;Electron beams;Electron microscopes;Spectroscopy;X-ray fluorescence spectrometry
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 01/31/2014 |
| Page Count | 22 |
| Themes | X-ray fluorescence spectrometry |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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