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BS ISO 20341:2003
Surface chemical analysis. Secondary-ion mass spectrometry. Method for estimating depth resolution parameters with multiple delta-layer reference materials
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Summary
Mass spectrometry;Statistical methods of analysis;Spectroscopy;Normal distribution;Surface chemistry;Chemical analysis and testing;Damping coefficient;Depth measurement;Surface properties;Test methods;Mathematical calculations;Secondary;Ions;Depth
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 08/08/2003 |
| Page Count | 14 |
| Themes | Depth |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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