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BS ISO 22489:2016
Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
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Summary
Test equipment;Spectroscopy;Wavelengths;X-ray analysis;Instrumental methods of analysis;X-rays;Specimen preparation;Microanalysis;Chemical analysis and testing;Dispersion (waves);Electron beams
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 10/31/2016 |
| Page Count | 26 |
| Themes | Electron beams |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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