Superseded
Standard
Historical
BS ISO 22493:2008
Microbeam analysis. Scanning electron microscopy. Vocabulary
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Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 10/31/2008 |
| Cancellation Date | 04/30/2014 |
| Page Count | 34 |
| Themes | Electron microscopes |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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30/04/2014
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31/10/2008
Superseded
Historical