Active
Standard
Most Recent
BS ISO 23812:2009
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth calibration for silicon using multiple delta-layer reference materials
Preview
Summary
Depth measurement;Mass spectrometry;Calibration;Surface chemistry;Secondary;Chemical analysis and testing;Spectroscopy;Depth;Ions;Silicon;Surfaces
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 05/31/2009 |
| Page Count | 30 |
| Themes | Surfaces |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
No products.