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BS ISO 24173:2024
Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
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Summary
Electron beams;Microanalysis;Test specimens;Orientation;Measurement;Diffraction;Chemical analysis and testing;Crystallography;Crystal structure;Electron microscopes
Notes
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 02/19/2024 |
| Page Count | 50 |
| Themes | Electron microscopes |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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31/10/2009
Withdrawn
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19/02/2024
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31/10/2009
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