DD IEC/PAS 60539-1-1:2008
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DD IEC/PAS 60539-1-1:2008

Directly heated negative temperature coefficient thermistors Blank detail specification. Sensing application. Assessment level EZ

Summary

Testing conditions;Resistors;Quality control;Assessed quality;Specification (approval);Thermistors;Semiconductor resistors;Acceptance (approval);Detail specification;Metal oxide semiconductors;Inspection;Electronic equipment and components;Temperature coefficient of resistance;Semiconductor devices

Technical characteristics

Publisher British Standards Institution (BSI)
Publication Date 05/31/2009
Page Count 16
Themes Semiconductor devices
EAN ---
ISBN ---
Weight (in grams) ---
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