DIN 32877:2000-08
Superseded Standard
Historical

DIN 32877:2000-08

Optoelectronic measurement of distance, profile and form

Summary

The document deals optoelectronic linear measurent methods. It covers concepts and principles of measurements, defines requirements and testing of characteristics quantities.

Notes

À remplacer par DIN 32877-1 (2018-12, t) (en préparation).

Technical characteristics

Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 08/01/2000
Page Count 12
EAN ---
ISBN ---
Weight (in grams) ---
No products.

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