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Standard
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DIN 41850-3:1985-09
Integrated film circuits; methods for the assessment of dielectric pastes
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Summary
The standard describes procedures for the assessment of dielectric pastes to be used in integrated film circuits. Thereby the suitability is to diffentiate for the three main applications cross-over, dielectric and protective coating. The tests, necessary for this assessment, are carried out by means of a test substrat the layout of which is laid down in this standard.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 09/01/1985 |
| Cancellation Date | 05/01/2016 |
| Page Count | 6 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
01/09/1985
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