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Standard
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DIN 50436:1976-10
Testing of semi-conducting inorganic materials - Measurement of the metalurgic thickness of epitaxial layers of silicon by the stacking fault method
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Summary
Prüfung halbleitender anorganischer Stoffe - Messung der metallurgischen Dicke von Silicium-Epitaxieschichten nach der Stapelfehlermethode
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 10/01/1976 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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