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Standard
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DIN 50437:1979-06
Testing of semi-conductive inorganic materials; measuring the thickness of silicon epitaxial layer thickness by infrared interference method
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Summary
Prüfung halbleitender anorganischer Stoffe; Messung der Dicke von Silicium-Epitaxieschichten mit der Infrarot-Interferenzmethode
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 06/01/1979 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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