Superseded
Standard
Historical
DIN 50438-1:1994-09
Testing of materials for semiconductor technology - Determination of impurity content in silicon by infrared absorption - Part 1: Oxygen
Preview
Summary
Prüfung von Materialien für die Halbleitertechnologie - Bestimmung des Verunreinigungsgehaltes in Silicium mittels Infrarot-Absorption - Teil 1: Sauerstoff
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 09/01/1994 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
No products.
Previous versions
