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DIN 50438-2:1982-08
Testing of materials for semiconductor technology; determination of impurty content in silicon by infrared absorption; carbon
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Summary
Prüfung von Materialien für die Halbleitertechnologie; Bestimmung des Verunreinigungsgehaltes in Silicium mittels Infrarot-Absorption; Kohlenstoff
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 08/01/1982 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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