DIN 50443-2:1994-06
Withdrawn Standard
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DIN 50443-2:1994-06

Testing of materials for semiconductor technology; recognition of defects and inhomogeneities in semiconductor single crystals by X-ray topography; III-V-semiconductor compounds

Summary

Prüfung von Materialien für die Halbleitertechnologie; Nachweis von Kristalldefekten und Inhomogenitäten in Halbleiter-Einkristallen mittels Röntgentopographie; III-V-Verbindungshalbleiter

Technical characteristics

Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 06/01/1994
Page Count 8
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ISBN ---
Weight (in grams) ---
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