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DIN 50449-2:1998-01
Testing of materials for semiconductor technology - Determination of impurity content in semiconductors by infrared absorption - Part 2: Boron in gallium arsenide
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Summary
Prüfung von Materialien für die Halbleitertechnologie - Bestimmung des Verunreinigungsgehaltes in III-V-Verbindungshalbleitern mittels Infrarotabsorption - Teil 2: Bor in Galliumarsenid
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 01/01/1998 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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