DIN 50451-1:1987-10

Testing of materials for semiconductor technology; determination of traces of metals in liquids; Ag, Au and Cu in nitric acid by means of AAS

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Summary

Prüfung von Materialien für die Halbleitertechnologie; Bestimmung von Metallspuren in Flüssigkeiten; Silber (Ag), Gold (Au) und Kupfer (Cu) in Salpetersäure mittels AAS

Technical characteristics

Publisher	Deutsche Institut für Normung e.V. (DIN)
Publication Date	10/01/1987
Page Count	8
EAN	---
ISBN	---
Weight (in grams)	---

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DIN 50451-1:2003-04

Essais des matériaux pour la technologie des semi-conducteurs - Dosage des éléments en traces dans les liquides - Partie 1: Argent (Ag), or (Au), calcium (Ca), cuivre (Cu), fer (Fe), potassium (K) et sodium (Na) dans l'acide nitrique par la méthode spectrométrique d'absorption atomique

01/04/2003

Withdrawn

Most Recent

DIN 50451-1:2002-01

Testing of materials for semiconductor technology - Determination of traces of metals in liquids - Part 1: Silver (Ag), Gold (Au), copper (Cu), iron (Fe), potassium (K) and sodium (Na) in nitric acid by AAS

01/01/2002

Superseded

Historical

DIN 50451-1:1987-10

Testing of materials for semiconductor technology; determination of traces of metals in liquids; Ag, Au and Cu in nitric acid by means of AAS

01/10/1987

Superseded

Historical

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