Superseded
Draft standard
Historical
DIN 51179:2016-03
Vitreous and porcelain enamels - Low-voltage test for detecting and locating defects on profiled surfaces - Slurry test
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Summary
This document specifies a low-voltage test method used to detect and identify the location of defects (pores, cracks or spalling) going to the substrate of enamel coatings on corrugated and/or beaded profiles.
Notes
Prévu pour remplacer DIN 51179 (2014-09).
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 03/01/2016 |
| Cancellation Date | 08/01/2016 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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