Superseded
Draft standard
Historical
DIN 58002:2000-11
Near-field-measurement of optical chip-components
Preview
Summary
Integrierte Optik - Nahfeldmessverfahren für einmodige optische Chipkomponenten
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 11/01/2000 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
No products.
Previous versions
01/12/2001
Withdrawn
Most Recent
01/11/2000
Superseded
Historical