DIN EN 14571:2005-07

This Standard describes a method using microresistivity instruments for nondestructive measurements of the thickness of high electrical conductivity metallic coatings, particularly silver and copper, on nonmetallic and nonconductive basis materials. The method is particularly applicable to the measurement of surface copper on plastics and through-hole copper of printed wiring panels where it has been extensively proven. Theoretically, the method is also applicable to any high electrical conductivity metallic coating (or foil) on a nonconductive nonmetallic basis material.