Superseded
Standard
Historical
DIN EN 60444-8:2004-03
Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2003); German version EN 60444-8:2003.
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Summary
This part of IEC 60444 explains the test fixture that allows the accurate measurement of resonance frequency, resonance resistance, and equivalent electrical circuit parameters of a leadless surface mounted quartz crystal units using zero phase technique as specified in IEC 60444-4 and IEC 60444-5.
Notes
A transition period, as set out in DIN EN 60444-8 (2017-11), exists until 2020-01-19.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 03/01/2004 |
| Cancellation Date | 11/01/2017 |
| Page Count | 12 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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