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DIN EN 60749-11:2003-04
Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature; Two-fluid-bath method (IEC 60749-11:2002); German version EN 60749-11:2002.
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Summary
The document defines the rapid change of temperature test method and the two-fluid-bath method. This test is applicable to all semiconductor devices. It is conducted to determine the resistance of a device to sudden exposure to extreme or rapid changes in the temperature and to the effect of alternate exposure to these extremes
Notes
Under certain conditions, DIN EN 60749 (2002-09) remains valid alongside this standard until 2005-07-01.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 04/01/2003 |
| Page Count | 10 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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