Superseded
Standard
Historical
DIN EN 60749-17:2003-09
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation (IEC 60749-17:2003); German version EN 60749-17:2003.
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Summary
The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to degradation in the neutron environment. The tests described herein are applicable to integrated circuits and discrete semiconductor devices. This test is intended for military- and space-related applications. It is a destructive test.
Notes
A transition period, as set out in DIN EN IEC 60749-17 (2019-11), exists until 2022-05-02.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 09/01/2003 |
| Page Count | 7 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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