Superseded
Standard
Historical
DIN EN 60749-18:2003-09
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 60749-18:2002); German version EN 60749-18:2003.
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Summary
The test procedure described in this standard defines the reqirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionisind radiation (total dose) effects from a cobalt-60 gamma ray source. In addition this procedure provides an accelerated annealing test for estimating low dose rate ionising radiation effects on devices
Notes
A transition period, as set out in DIN EN IEC 60749-18 (2020-02), exists until 2022-05-15.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 09/01/2003 |
| Page Count | 15 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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