DIN EN 60749-23/A1:2009-09
Superseded Draft amendment
Historical

DIN EN 60749-23/A1:2009-09

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 47/2017/CDV:2009); German version EN 60749-23:2004/FprA1:2009
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Summary

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 23: Lebensdauer bei hoher Temperatur (IEC 47/2017/CDV:2009); Deutsche Fassung EN 60749-23:2004/FprA1:2009

Technical characteristics

Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 09/01/2009
Page Count 8
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