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DIN EN 60749-24:2004-09
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST (IEC 60749-24:2004); German version EN 60749-24:2004
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Summary
The unbiased highly accelerated stress testing (HAST) specified in this part of DIN EN 60749 is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 09/01/2004 |
| Page Count | 11 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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