Superseded
Standard
Historical
DIN EN 60749-26:2007-01
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (IEC 60749-26:2006); German version EN 60749-26:2006.
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Summary
This part of DIN EN 60749 establishes a standard procedure for testing and classifiying semiconduror devices according to their susceptibility to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The objective is to provide reliable, repeatable HBM ESD test results so that accurate classifications can be performed.
Notes
A transition period, as set out in DIN EN 60749-26 (2014-09), exists until 2017-04-14.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 01/01/2007 |
| Cancellation Date | 09/01/2014 |
| Page Count | 16 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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