Superseded
Draft standard
Historical
DIN EN 60749-28:2012-07
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic Discharge (ESD) Sensitivity Testing - Direct contact charged device model (DC-CDM) (IEC 47/2123/CD:2012)
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Summary
This part of DIN EN 60749 describes the direct contact charged device model (DC-CDM) for the electrostatic discharge test method which is used to evaluate the sensitivity of integrated circuits to electrostatic discharges. This test method can be used to reproduce and evaluate the effect of the discharge of a charged metal body to a semiconductor device.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 07/01/2012 |
| Cancellation Date | 02/01/2018 |
| Page Count | 46 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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