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DIN EN 60749-33:2004-09
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave (IEC 60749-33:2004); German version EN 60749-33:2004
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Summary
The unbiased autoclave test is performed to evaluate the moisture resistance integrity of non-hermetic packaged solid-state devices using moisture condensing or moisture saturated steam environments.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 09/01/2004 |
| Page Count | 10 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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