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DIN EN 60749-36:2003-12
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state (IEC 60749-36:2003); German version EN 60749-36:2003.
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Summary
This part of IEC 60749 provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.
Notes
Under certain conditions, DIN EN 60749 (2002-09) remains valid alongside this standard until 2006-04-01.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 12/01/2003 |
| Page Count | 7 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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