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Draft standard
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DIN EN 60749-42:2012-07
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature humidity storage (IEC 47/2131/CD:2012)
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Summary
This part of DIN EN 60749 provides a test method to evaluate the endurance of semiconductor devices used in high temperature and high humidity environments.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 07/01/2012 |
| Cancellation Date | 05/01/2015 |
| Page Count | 14 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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