DIN EN 62047-29:2016-08

This part of IEC 62047 specifies a relaxation test method for measuring electromechanical properties of freestanding conductive thin-films for micro-electromechanical systems (MEMS) under controlled strain and room temperature. Freestanding thin-films of conductive materials are extensively utilized in MEMS, opto-electronics, and flexible/wearable electronics products. Freestanding thin-films in the products experience external and internal stresses which could be relaxed even under room temperature during a period of operation, and this relaxation leads to time-dependent variation of electrical performances of the products. This test method is valid for isotropic, homogeneous, and linearly viscoelastic materials.