Superseded
Draft standard
Historical
DIN EN 62326-15:2012-01
Printed boards - Device Embedded Substrate - General electrical test guide for device embedded substrate with active devices, passive components (Capacitor, Resistor, Inductor, etc), Integrated passive device (IPD), and discrete packages (IEC 91/995/CD:2011)
Preview
Summary
The purpose of this standard is to provide users the necessary information on the electrical test methods, which include interconnection open/short test as well as device functional test, for device embedded substrate. It is also to provide the test solution by defining technical levels of electrical test for device embedded substrate.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 01/01/2012 |
| Cancellation Date | 04/01/2014 |
| Page Count | 33 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
No products.
Previous versions
01/01/2012
Superseded
Historical