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DIN EN 62415:2010-12
Semiconductor devices - Constant current electromigration test (IEC 62415:2010); German version EN 62415:2010
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Summary
This document describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 12/01/2010 |
| Page Count | 12 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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