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DIN EN IEC 60749-13:2018-10
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (IEC 60749-13:2018); German version EN IEC 60749-13:2018.
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Summary
This part of DIN EN 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion.
Notes
DIN EN 60749-13 (2003-04) remains valid alongside this standard until 2021-03-22.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 10/01/2018 |
| Page Count | 15 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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