Superseded Draft standard
Historical

DIN IEC 47(CO)1042:1988-12

Semiconductor devices; measuring methods for matched-pair bipolar transistors; identical with IEC 47(Central Office)1042

Summary

Halbleiterbauelemente; Meßverfahren für gepaarte bipolare Transistoren; Identisch mit IEC 47(CO)1042

Technical characteristics

Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 12/01/1988
Page Count 8
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ISBN ---
Weight (in grams) ---
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