Superseded
Draft standard
Historical
DIN IEC 47(CO)1042:1988-12
Semiconductor devices; measuring methods for matched-pair bipolar transistors; identical with IEC 47(Central Office)1042
Summary
Halbleiterbauelemente; Meßverfahren für gepaarte bipolare Transistoren; Identisch mit IEC 47(CO)1042
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 12/01/1988 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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