Superseded
Draft standard
Historical
DIN IEC 47(CO)1084:1989-04
Semiconductor devices; mechanical and climatic test methods; amendment to IEC 60749; identical with IEC 47(Central Office)1084
Preview
Summary
Halbleiterbauelemente; Mechanische und klimatische Prüfverfahren; Ergänzung zu IEC 60749; Identisch mit IEC 47(CO)1084
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 04/01/1989 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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