Superseded
Draft standard
Historical
DIN IEC 47(CO)1085:1990-04
Semiconductor devices; mechanical and climatic test methods, internal moisture content; identical with IEC 47(Central Office)1085
Preview
Summary
Halbleiterbauelemente; Mechanische und klimatische Prüfverfahren; Innerer Feuchtigkeitsgehalt; Identisch mit IEC 47(CO)1085
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 04/01/1990 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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