Withdrawn
Draft standard
Most Recent
DIN IEC 47(CO)1116:1989-05
Semiconductor devices; amendment to the generic specification IEC 60747-10; accelerated test procedures; identical with IEC 47/47A(Central Office)1116/205
Preview
Summary
Halbleiterbauelemente; Ergänzung der Fachgrundspezifikation IEC 60747-10; Beschleunigte Prüfverfahren; Identisch mit IEC 47/47A(CO)1116/205
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 05/01/1989 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
No products.