Superseded
Draft standard
Historical
DIN IEC 47(CO)1169:1991-08
Semiconductor devices; amendment to IEC 60749: gross leak test; identical with IEC 47(Central Office)1169
Preview
Summary
Halbleiterbauelemente; Ergänzung der IEC 60749: Grobleck-Prüfverfahren; Identisch mit IEC 47(CO)1169
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 08/01/1991 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
No products.
Previous versions
01/08/1991
Superseded
Historical