Superseded
Draft standard
Historical
DIN IEC 47(CO)1186:1991-08
Semiconductor devices; sealing test Q<(Index)K> for semiconductor devices; identical with IEC 47(Central Office)1186
Preview
Summary
Halbleiterbauelemente; Dichtheitsprüfung Q<(Index)K> für Halbleiterbauelemente; Identisch mit IEC 47(CO)1186
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 08/01/1991 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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