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DIN IEC 47(CO)1187:1991-09

Semiconductor devices; amendment of testgroups B5, C5 and C7 of IEC 747-11; identical with IEC 47(Central Office)1187

Summary

Halbleiterbauelemente - Ergänzung der Prüfgruppen B5, C5 und C7 in IEC 747-11; Identisch mit IEC 47(CO)1187

Technical characteristics

Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 09/01/1991
Page Count 8
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