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DIN IEC 47(CO)1246:1993-01
Electrostatic sensitive semiconductor devices sensitive to voltage pulses of short duration; test methods; identical with IEC 47(Central Office)1246
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Summary
Elektrostatisch gefährdete Halbleiterbauelemente, empfindlich gegen Spannungsimpulse kurzer Dauer; Prüfverfahren; Identisch mit IEC 47(CO)1246
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 01/01/1993 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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